
发表论文
发表论文 - 全定制 IC CAD |
The full text of most of these papers may be found at the IEEE website at www.ieee.org. |
G. Vakanas, S. Munir, E.Tejnil, D. Bald, R. Nagpal "Lithography-based automation in the Design
of Program Defect Masks" Proc. SPIE Feb. 2004